CALIBRATION OF ELECTRON SPECTROMETER ENERGY SCALES FOR AES AND XPS

ISO-Compliant calibration of energy and intensity scales of electron spectrometers.

The International Organization for Standardization (ISO) decided to establish a Technical Committee 201 (TC201) on the standardization of surface chemical analysis in 1991. Since then, TC201 has published 38 ISO standards. They concern the vocabulary, instrument specifications, pretreatments of specimen, the procedures for analysis, apparatus alignments, measurement conditions, quantification a...

Calibration of electron spectrometer resolution in attosecond streak camera.

We report a new method for determining the energy resolution of time-of-flight spectrometers for detecting photoelectrons produced with attosecond XUV pulses. By measuring the width of the 2s2p autoionization line of helium, we found the resolution of our spectrometer to be approximately 0.6 eV for electrons at 35.5 eV. Furthermore, the resolution in the 10 to 35 eV range was determined by appl...

XPS and AES studies of UHTC ZrB2-SiC-Si3N4 treated with solar energy

Characterization of tungsten tips for STM by SEM/AES/XPS

For the first time, both X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques were applied in analysis of surface contamination of electrochemically etched Scanning Tunneling Microscope (STM) tungsten tips. Carbon monoxide, graphite, tungsten carbide and tungsten oxide were found as main surface contaminations of STM tungsten tips. The thickness of tungsten ox...

A novel spectrometer for spin-polarized electron energy-loss spectroscopy

By making use of advanced methods for the calculation of electron trajectories in the presence of space charge fields we have designed and built a novel electron energy-loss spectrometer for the purpose of measuring spin flip excitations at surfaces. The measurement of the spin asymmetry requires a deflection angle between the photocathode and the sample position which amounts to 90° in total. ...